Welcome to CEC-ICMC

Chattanooga Local and Travel Information

Important Dates

Call for Papers/Abstract Submission Info

Conference & Technical Program

Short Courses

Conference Registration

Exhibit Information

Publication Information



Sponsorship & Advertisement Opportunities

Past Proceedings

Ancillary Meeting Request

2007 CEC-ICMC Committee

Future & Past CEC-ICMCs

Related Conferences & Websites


Conference/Technical Program

The first character of the program number, C or M, represents the conference designation, C for the CRYOGENIC Engineering Conference (CEC), M for the International Cryogenic MATERIALS Conference (ICMC). The second character, 1, 2, 3, or 4, denotes the day of the Conference, Tuesday, Wednesday, Thursday, and Friday, respectively. The third character, A-Z differentiates the sessions on a given day. The final character denotes the order within the session. There are no concurrent poster and oral sessions.

If you need to make additions or changes to your abstract, please contact Annett D’Antonio at cecicmc07@centennialconferences.com. If you need to withdraw your abstract from the conference program, please submit your request by going thru the Abstract Withdrawal Request link.

NOTE: The CEC/ICMC 2007 Conference Organizers occasionally need to make changes to the program. We urge you to check the schedule before and during the conference for last minute changes.

Withdrawals after 6/28/07

C1-B-06; D.L. Kim
M1-B-11; V. Toplosky
C1-J-01; P. Bradley
C1-J-05; X. Granados
C1-M-07; D. Ladner
C1-O-02; D. Curran
C1-O-03; J. Sutliff
C1-P-04; G. Ferlin
C1-Q-04; M. White
C2-C-02; W. Dai
C2-D-02; D. Taylor
C2-D-03; D. Taylor
C2-D-05; H. Cho
C2-H-06; B. Jackson Sr.
C2-I-05; S. Clark
C2-K-01; A. Crabtree
C2-L-02; M. Houston
C2-L-05; R. Boyle
C2-M-05; J. Panek
M2-M-02; D. Nguyen
M2-O-06; D. Nguyen
M2-R-04; D. Knoll
C2-S-03; J. Yuan
C3-E-05; M.-H. Chang
C3-F-01; Q. Xu
C3-L-04; K. Brodzinksi
C3-M-02; Z.H. Gan
M3-L-06; P. McIntyre
M3-L-07; P. McIntyre
M4-B-02; P. McIntyre
M4-C-07; E. Barzi
C4-D-03; S. Yuan
C4-D-04; W. Scheirer
C4-E-04; C. Gibson

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